Power Delivery Stress Test on Nvidia Jetson Orin Nano Dev Board

Issue Overview

Users are experiencing challenges while attempting to stress test the power delivery on the Nvidia Jetson Orin Nano 4 GB carrier board. The specific symptoms include difficulties in monitoring power transients and excessive ripple during stress testing of various components such as the System on Chip (SoC), wireless modules, and NVMe storage. The issue arises primarily during setup and testing phases, where users aim to evaluate the stability and performance of the power delivery system under load.

The context of the problem involves both hardware and software specifications related to the Orin Nano 4 GB. Users have indicated a need for effective methods to conduct these tests, particularly focusing on identifying any potential weaknesses in power delivery that could impact overall system functionality. The frequency of this issue appears to be consistent among users engaged in similar testing scenarios, highlighting its significance in ensuring reliable operation. The impact of inadequate power delivery can lead to system instability, unexpected shutdowns, or performance degradation during intensive tasks.

Possible Causes

• Hardware Incompatibilities or Defects: Incompatible components or defective hardware may lead to unstable power delivery, causing transients or excessive ripple.

• Software Bugs or Conflicts: Issues within the software stack, including the operating system or drivers, might interfere with accurate power monitoring and stress testing.

• Configuration Errors: Incorrect settings in the system configuration can lead to improper functioning of power management features.

• Driver Issues: Outdated or incompatible drivers may not support proper power management, leading to erratic behavior during stress tests.

• Environmental Factors: External conditions such as temperature fluctuations or inadequate power supply can affect the performance of the carrier board during testing.

• User Errors or Misconfigurations: Improper setup or misunderstanding of testing procedures can result in inaccurate readings or failure to achieve desired stress test conditions.

Troubleshooting Steps, Solutions & Fixes

1. Diagnosing the Problem:

   • Begin by checking hardware connections and ensuring all components are properly seated.
   • Use a multimeter to measure voltage levels at various points on the carrier board during operation.

2. Gathering System Information:

   • Execute the following command to check for any driver issues:

     dmesg | grep -i error
     

   • Review system logs for any anomalies related to power management:

     journalctl -b | grep -i power
     

3. Isolating the Issue:

   • Test with different power supplies to rule out power delivery issues.
   • If possible, swap out components (e.g., NVMe drives) to identify if specific hardware is causing problems.

4. Potential Fixes and Workarounds:

   • Ensure that all firmware and drivers are up-to-date. Refer to Nvidia’s official documentation for updates.
   • Consider using dedicated software tools for stress testing and monitoring, such as Jetson/L4T/TRT Customized Example from eLinux.org for guidance on effective testing methodologies.
   • Implement thermal management solutions if overheating is suspected during stress tests.

5. Best Practices for Prevention:

   • Regularly update software and firmware to mitigate bugs that could affect performance.
   • Conduct routine checks of hardware components for signs of wear or damage.
   • Maintain an optimal operating environment to minimize external influences on device performance.

6. Further Investigation:

   • If issues persist after following these steps, consider reaching out to Nvidia support forums or communities for additional insights and troubleshooting assistance.

By following these structured steps, users can effectively diagnose and address issues related to power delivery stress testing on the Nvidia Jetson Orin Nano Dev board.